Succession-dependent shock models

被引:3
作者
Finkelstein, MS
机构
[1] St Petersburg Electropribor Inst., 197046 St Petersburg
来源
MICROELECTRONICS AND RELIABILITY | 1996年 / 36卷 / 02期
关键词
D O I
10.1016/0026-2714(95)00096-K
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A system that is subject to external shocks of different types is studied. Each shock can lead to a breakdown or an accident, stopping the system performance with a certain probability, depending on the succession of shock arrivals and times since the latest shocks. A case of a fixed number of shocks is treated for illustration. Another model presents shocks arriving according to a non-homogeneous Poisson process or a renewal process.
引用
收藏
页码:195 / 197
页数:3
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