Nonlinear, eddy current damped, thin-film write dead model

被引:29
作者
Klaassen, KB
Hirko, RG
机构
[1] IBM Research Division, San Jose
关键词
D O I
10.1109/20.538678
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new thin-film write head model is described which is based on electrical impedance versus frequency measurements. The model includes the effects of head saturation and eddy current damping making it useful for simulation of the electrical input port (head coil) and magnetic output port (pole tip) signals, which would be observed under actual write conditions.
引用
收藏
页码:3524 / 3526
页数:3
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