An additional axis for the surface X-ray diffractometer

被引：16

作者：

Takahasi, M ^{[1
]}

Mizuki, J ^{[1
]}

机构：

[1] JAERI, SPring8, Kamigori, Hyogo 67812, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1998年 / 5卷

关键词：

surface X-ray diffraction; diffractometers; correction factors;

D O I：

10.1107/S0909049597016014

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new surface X-ray diffractometer based on a K-type diffractometer will be installed in BL14B1, SPring-X. This diffractometer has an additional axis on its detector arm for rotating the receiving slit about the normal of the slit plane, in addition to two axes for positioning the detector. This additional axis is founded on the consideration of the correction factor which has been derived so as to be valid for the z-axis mode measurement using any incoming and outgoing angles of the X-ray beam. The rotational slit allows accurate measurement of the surface structure factor up to large perpendicular momentum transfer.

引用

收藏

页码：893 / 895

页数：3

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