Stochastic schemes of dielectric relaxation in correlated-cluster systems

被引:44
作者
Jonscher, AK [1 ]
Jurlewicz, A
Weron, K
机构
[1] Univ London, Egham TW20 0EX, Surrey, England
[2] Wroclaw Univ Technol, Hugo Steinhaus Ctr Stochast Methods, PL-50370 Wroclaw, Poland
[3] Wroclaw Univ Technol, Inst Math, PL-50370 Wroclaw, Poland
[4] Wroclaw Univ Technol, Inst Phys, PL-50370 Wroclaw, Poland
关键词
D O I
10.1080/0010751031000077369
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Unlike the classical exponential relaxation law, the widely prevailing universal law with its fractional power-law dependence of susceptibility on frequency cannot be explained in the framework of arty intuitively simple physical concept. The resulting constancy of the ratio of the imaginary to the real parts of the complex susceptibility, known as the 'energy criterion', has a pleasing simplicity but the understanding of its origins needs a special theoretical treatment. Fresh light has been shed on the stochastic nature of the dielectric relaxation by a novel stochastic approach introduced in the last decade. Since the theoretical analysis involved is rather unfamiliar, the aim of this paper is to give some useful comments and suggestions which should help to follow in detail the proposed stochastic scheme of relaxation leading to the well-known empirical responses. We justify the universality of the potter-law macroscopic response as well as Jonscher's screening and energy criterion ideas, and we give a new basis to the research into the significance of relaxation processes.
引用
收藏
页码:329 / 339
页数:11
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