The efficiency of critical slicing in fault localization

被引:10
作者
Al-Khanjari, ZA
Woodward, MR
Ramadhan, H
Kutti, NS
机构
[1] Sultan Qaboos Univ, Comp Sci Dept, Al Khoud 123, Oman
[2] Univ Liverpool, Dept Comp Sci, Liverpool L69 7ZF, Merseyside, England
关键词
mutation testing; strong and weak mutations; dead; live and equivalent mutants; static and dynamic slicing; critical slicing; mutation operator; statement deletion (Sdl); Mothra Mutation Testing System; Fortran-77;
D O I
10.1007/s11219-005-6214-x
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
In software testing, developing effective debugging strategies is important to guarantee the reliability of software under testing. A heuristic technique is to cause failure and therefore expose faults. Based on this approach mutation testing has been found very useful technique in detecting faults. However, it suffers from two problems with successfully testing programs: (1) requires extensive computing resources and (2) puts heavy demand on human resources. Later, empirical observations suggest that critical slicing based on Statement Deletion (Sdl) mutation operator has been found the most effective technique in reducing effort and the required computing resources in locating the program faults. The second problem of mutation testing may be solved by automating the program testing with the help of software tools. Our study focuses on determining the effectiveness of the critical slicing technique with the help of the Mothra Mutation Testing System in detecting program faults. This paper presents the results showing the performance of Mothra Mutation Testing System through conducting critical slicing testing on a selected suite of programs.
引用
收藏
页码:129 / 153
页数:25
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