TDI imaging - A tool for profilometry and automated visual inspection

被引：16

作者：

Sajan, MR ^{[1
]}

Tay, CJ

Shang, HM

Asundi, A

机构：

[1] Natl Univ Singapore, Dept Mech & Prod Engn, Singapore 119260, Singapore

[2] Nanyang Technol Univ, Sch Mech & Prod Engn, Singapore 639798, Singapore

来源：

OPTICS AND LASERS IN ENGINEERING | 1998年 / 29卷 / 06期

关键词：

D O I：

10.1016/S0143-8166(97)00106-1

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

TDI imaging is introduced as a solution to industrial web inspection under low-light illumination. In addition to the original purpose of recording clear blur-free images of the objects moving over industrial platforms, it can also be used as a tool for profilometry and automated visual inspection when coupled with proper structured light illumination modules. This paper illustrates a system employing a pulsed laser diol le, uniform intensity line generating optics and a high-speed TDI imager for recording structured light patterns from rotating cylindrical objects. Defect or shape information is coned as distortions in a regular grating pattern recorded by the TDI imager. The shape of defect profile is retrieved by employing Fourier Transform and scanning spatial phase detection techniques. (C) 1998 Elsevier Science Ltd. All rights reserved.

引用

页码：403 / 411

页数：9

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