Radiation-Corrected Harman Method for Characterization of Thermoelectric Materials

被引：14

作者：

Ao, Xianyu ^{[1
]}

de Boor, Johannes ^{[1
]}

Schmidt, Volker ^{[1
]}

机构：

[1] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany

来源：

ADVANCED ENERGY MATERIALS | 2011年 / 1卷 / 06期

关键词：

thermoelectric materials; figure of merit; Harman method; radiation correction; THERMAL-CONDUCTIVITY; RESISTIVITY; THERMOPOWER;

D O I：

10.1002/aenm.201100272

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Thermoelectric materials have received renewed interest in the current search for renewable energy. The Harman method is commonly used to determine thermoelectric properties of materials, but due to parasitic heat losses the accuracy of this method is poor at elevated temperatures. Here, we present a simple and effective approach to correct for radiation loss.

引用

页码：1007 / 1011

页数：5

共 19 条

[1] Experimental setup for the measurement of the electrical resistivity and thermopower of thin films and bulk materials -: art. no. 053907 [J].

Boffoué, O ;

Jacquot, A ;

Dauscher, A ;

Lenoir, B ;

Stölzer, M .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (05)

[2] Experimental set-up for thermopower and resistivity measurements at 100-1300 K [J].

Burkov, AT ;

Heinrich, A ;

Konstantinov, PP ;

Nakama, T ;

Yagasaki, K .

MEASUREMENT SCIENCE AND TECHNOLOGY, 2001, 12 (03) :264-272

[3]

Busch G., 1961, Helv. Phys. Ada, V34, P1

[4] Complete Characterization of Thermoelectric Materials by a Combined van der Pauw Approach [J].

de Boor, Johannes ;

Schmidt, Volker .

ADVANCED MATERIALS, 2010, 22 (38) :4303-+

[5] New directions for low-dimensional thermoelectric materials [J].

Dresselhaus, Mildred S. ;

Chen, Gang ;

Tang, Ming Y. ;

Yang, Ronggui ;

Lee, Hohyun ;

Wang, Dezhi ;

Ren, Zhifeng ;

Fleurial, Jean-Pierre ;

Gogna, Pawan .

ADVANCED MATERIALS, 2007, 19 (08) :1043-1053

[6] SPECIAL TECHNIQUES FOR MEASUREMENT OF THERMOELECTRIC PROPERTIES [J].

HARMAN, TC .

JOURNAL OF APPLIED PHYSICS, 1958, 29 (09) :1373-1374

[7] MEASUREMENT OF THERMAL CONDUCTIVITY BY UTILIZATION OF THE PELTIER EFFECT [J].

HARMAN, TC ;

CAHN, JH ;

LOGAN, MJ .

JOURNAL OF APPLIED PHYSICS, 1959, 30 (09) :1351-1359

[8] Evaluation of the figure of merit on thermoelectric materials by harman method [J].

Iwasaki, H ;

Koyano, M ;

Hori, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (11A) :6606-6609

[9]

Jacquot A., 2007, 5 EUR C THERM OD UKR

[10] Temperature measurements by optical pyrometry during the epitaxial growth of semiconductors [J].

Lévêque, G ;

Nouaoura, M .

EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 1998, 4 (02) :227-233

← 1 2 →