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Two-layer behaviour during low-energy ion ablation of CdTe(001) studied by in situ X-ray diffraction and by Monte Carlo simulation

被引：8
作者：
Etgens, VH
RibeiroTeixeira, RM
Mors, PM
Veron, MB
Tatarenko, S
SauvageSimkin, M
Alvarez, J
Ferrer, S
机构：
[1] UNIV FED RIO GRANDE SUL,INST FIS,BR-91501970 PORTO ALEGRE,RS,BRAZIL
[2] CEA,MNJS,CNRS,LURE,F-91405 ORSAY,FRANCE
[3] UNIV GRENOBLE 1,CNRS,SPECTROMETRIE PHYS LAB,F-38402 GRENOBLE,FRANCE
[4] EUROPEAN SYNCHROTRON RADIAT FACIL,F-38043 GRENOBLE,FRANCE
来源：
EUROPHYSICS LETTERS | 1996年 / 36卷 / 04期
关键词：
D O I：
10.1209/epl/i1996-00221-7
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The evolution of the CdTe(001) surface during ion bombardment was studied by grazing incidence X-ray diffraction (GIXD) and by Monte Carlo simulation. A layer-by-layer removal was observed at 270 degrees C which evolves to a step-flow mode above 300 degrees C. An anisotropic relaxation of the surface lattice parameter and a long-distance correlation between islands along the [1-10] direction were observed during sputtering.
引用
收藏
页码：271 / 276
页数：6
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