Interface layer thickness effect on the photocurrent of Pt sandwiched polycrystalline ferroelectric Pb(Zr, Ti)O3 films

被引:34
作者
Cao, Dawei [1 ]
Zhang, Hui
Fang, Liang
Dong, Wen
Zheng, Fengang
Shen, Mingrong
机构
[1] Soochow Univ, Dept Phys, Suzhou 215006, Peoples R China
基金
中国国家自然科学基金;
关键词
THIN-FILMS; ZIRCONATE-TITANATE; BIFEO3;
D O I
10.1063/1.3488829
中图分类号
O59 [应用物理学];
学科分类号
摘要
Based on the analysis of the photocurrent behavior of Pt sandwiched Pb(Zr0.2Ti0.8)O-3 (PZT) films, the experimental evidence of top Pt/PZT interface layer thickness effect on the photocurrent is reported. It was well established before that the photocurrent of metal/ferroelectric film is attributed to the height of Schottky contact barrier. However, our results suggest that the photocurrent of Pt/PZT interface contact is determined not only by the barrier height but also by the interface layer thickness, namely, by the built-in electrical field at the interface layer. The mechanism behind such photocurrent phenomenon is proposed. (C) 2010 American Institute of Physics. [doi:10.1063/1.3488829]
引用
收藏
页数:3
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