Method for measurement of the thermal diffusivity in solids: Application to metals, semiconductors, and thin materials

被引:39
作者
Calderon, A
Hernandez, RAM
Tomas, SA
Cruz-Orea, A
Sinencio, FS
机构
[1] CINVESTAV IPN, Dept Fis, Mexico City 07000, DF, Mexico
[2] CINVESTAV IPN, PMCATA, Mexico City 07000, DF, Mexico
关键词
D O I
10.1063/1.368957
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a method for determining the thermal diffusivity in opaque solids by means of an analysis of the photoacoustic phase signal at low modulation frequencies using the open-cell photoacoustic technique. We show for f less than or equal to (pi/2)(2)f(c), where f(c) is the modulation frequency at which the thermal diffusion length matches the sample thickness, the photoacoustic phase signal can be written in linear form with the modulation frequency f. Then, obtaining the proportionality coefficient by fitting the experimental data, the thermal diffusivity of the sample can be determined. The advantage of this method is that it is realized in a range of modulation frequencies below those normally used, hence, the photoacoustic signal should be alone attributed to the mechanism of thermal diffusion. Moreover, the signal-to-noise ratio will be more reliable. This method was tested in some samples and it is also shown to be important in solids with high diffusivity values and thin materials. (C) 1998 American Institute of Physics. [S0021-8979(98)04922-6].
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页码:6327 / 6329
页数:3
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