Magnetization switching of submicrometer Co dots induced by a magnetic force microscope tip

被引:66
作者
Kleiber, M
Kummerlen, F
Lohndorf, M
Wadas, A
Weiss, D
Wiesendanger, R
机构
[1] Univ Hamburg, Inst Appl Phys, D-20355 Hamburg, Germany
[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany
[3] Univ Regensburg, Inst Expt & Appl Phys, D-93040 Regensburg, Germany
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 09期
关键词
D O I
10.1103/PhysRevB.58.5563
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have applied magnetic force microscopy (MFM) with an in situ electromagnet to study the switching of the magnetization of submicrometer Co dots fabricated by means of electron-beam lithography. By using the MFM tip as a local-field source, the magnetization of individual single-domain Co dots could be reversed. Micromagnetic simulations show that the switching process is induced by the stray field of the MFM tip. Furthermore, the external field that is necessary to support switching of the dot depends on the tip-dot separation.
引用
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页码:5563 / 5567
页数:5
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