Effect of roughness correlations in multilayers on Bragg peaks in X-ray diffuse scattering

被引:23
作者
Kaganer, VM
Stepanov, SA
Kohler, R
机构
[1] MPG AG RONTGENBEUGUNG, D-10117 BERLIN, GERMANY
[2] RUSSIAN ACAD SCI, INST CRYSTALLOG, MOSCOW 117333, RUSSIA
[3] MINSK NUCL PROBLEMS INST, MINSK 220050, BELARUS
关键词
D O I
10.1016/0921-4526(95)00902-7
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The peaks in X-ray diffuse scattering associated with the diffraction of the incident or scattered waves from a periodically layered structure are investigated analytically and compared with numerical calculations. It is shown that if the roughness of the periodic interfaces is uncorrelated, the peaks follow the intensity of the X-ray standing wave at the interfaces. Interference effects due to correlated interfacial roughness can change the sense of the peak (sequence of maximum and minimum). The factors controlling the peak sense are derived and applied to explain the results of numerical calculations.
引用
收藏
页码:34 / 43
页数:10
相关论文
共 36 条
[1]  
ABELES F, 1948, ANN PHYS-PARIS, V3, P504
[2]  
Abeles F, 1950, ANN PHYS-PARIS, V5, P596, DOI DOI 10.1051/ANPHYS/195012050596
[3]   REFLECTIVITY AND ROUGHNESS OF X-RAY MULTILAYER MIRRORS - SPECULAR REFLECTION AND ANGULAR SPECTRUM OF SCATTERED RADIATION [J].
ANDREEV, AV ;
MICHETTE, AG ;
RENWICK, A .
JOURNAL OF MODERN OPTICS, 1988, 35 (10) :1667-1687
[4]   EFFECT OF DYNAMICAL DIFFRACTION IN X-RAY FLUORESCENCE SCATTERING [J].
BATTERMAN, BW .
PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 133 (3A) :A759-&
[5]   X-RAY REFLECTIVITY AND ADSORPTION-ISOTHERM STUDY OF FRACTAL SCALING IN VAPOR-DEPOSITED FILMS [J].
CHIARELLO, R ;
PANELLA, V ;
KRIM, J ;
THOMPSON, C .
PHYSICAL REVIEW LETTERS, 1991, 67 (24) :3408-3411
[6]   SURFACE SCATTERING OF X-RAYS IN THIN-FILMS .2. EXPERIMENTS ON THIN SOAP FILMS [J].
DAILLANT, J ;
BELORGEY, O .
JOURNAL OF CHEMICAL PHYSICS, 1992, 97 (08) :5837-5843
[7]   SURFACE SCATTERING OF X-RAYS IN THIN-FILMS .1. THEORETICAL TREATMENT [J].
DAILLANT, J ;
BELORGEY, O .
JOURNAL OF CHEMICAL PHYSICS, 1992, 97 (08) :5824-5836
[8]  
DEBOER DKG, 1995, J PHYS D APPL PHYS, V28, pA227, DOI 10.1088/0022-3727/28/4A/044
[9]   EVIDENCE OF SELF-AFFINE ROUGH INTERFACES IN A LANGMUIR-BLODGETT-FILM FROM X-RAY REFLECTOMETRY [J].
GIBAUD, A ;
COWLAM, N ;
VIGNAUD, G ;
RICHARDSON, T .
PHYSICAL REVIEW LETTERS, 1995, 74 (16) :3205-3208
[10]   X-RAY REFLECTION FROM ROUGH LAYERED SYSTEMS [J].
HOLY, V ;
KUBENA, J ;
OHLIDAL, I ;
LISCHKA, K ;
PLOTZ, W .
PHYSICAL REVIEW B, 1993, 47 (23) :15896-15903