Synthesis and characterization of titania films on Mo(110)

被引:42
作者
Lai, X [1 ]
Guo, Q [1 ]
Min, BK [1 ]
Goodman, DW [1 ]
机构
[1] Texas A&M Univ, Dept Chem, College Stn, TX 77842 USA
关键词
titanium oxide; molybdenum; scanning tunneling microscopy; X-ray photoelectron spectroscopy; growth;
D O I
10.1016/S0039-6028(01)01094-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Ultra-thin titania films were grown on a Mo(1 1 0) substrate by vapor depositing Ti in an O-2 ambient (5 x 10(-7) Torr) at 600 K, followed by annealing to 900-1200 K. X-ray photoelectron spectroscopy showed that titanium oxide films annealed to 900 K were partially reduced, exhibiting Ti4+, Ti3+ and Ti2+ species, whereas films annealed to 1200 K were fully oxidized and exhibited only Ti4+. Corresponding scanning tunneling microscopy measurements revealed layer-by-layer growth of titania films on Mo(1 1 0) at 900 K. Flat terraces with three different orientations were observed. The line spacings between the neighboring atomic rows for all terraces were similar to6.5 Angstrom, suggesting epitaxial growth of TiO2(1 1 0)-(1 x 1). A further anneal of the films to 1200 K led to three-dimensional, rough surfaces for the fully oxidized films, indicating the formation of stable crystallites at high temperature. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1 / 8
页数:8
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