Synthesis and characterization of titania films on Mo(110)

被引：42

作者：

Lai, X ^{[1
]}

Guo, Q ^{[1
]}

Min, BK ^{[1
]}

Goodman, DW ^{[1
]}

机构：

[1] Texas A&M Univ, Dept Chem, College Stn, TX 77842 USA

来源：

SURFACE SCIENCE | 2001年 / 487卷 / 1-3期

关键词：

titanium oxide; molybdenum; scanning tunneling microscopy; X-ray photoelectron spectroscopy; growth;

D O I：

10.1016/S0039-6028(01)01094-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Ultra-thin titania films were grown on a Mo(1 1 0) substrate by vapor depositing Ti in an O-2 ambient (5 x 10(-7) Torr) at 600 K, followed by annealing to 900-1200 K. X-ray photoelectron spectroscopy showed that titanium oxide films annealed to 900 K were partially reduced, exhibiting Ti4+, Ti3+ and Ti2+ species, whereas films annealed to 1200 K were fully oxidized and exhibited only Ti4+. Corresponding scanning tunneling microscopy measurements revealed layer-by-layer growth of titania films on Mo(1 1 0) at 900 K. Flat terraces with three different orientations were observed. The line spacings between the neighboring atomic rows for all terraces were similar to6.5 Angstrom, suggesting epitaxial growth of TiO2(1 1 0)-(1 x 1). A further anneal of the films to 1200 K led to three-dimensional, rough surfaces for the fully oxidized films, indicating the formation of stable crystallites at high temperature. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：1 / 8

页数：8

共 20 条

[11] ATOMIC-SCALE SURFACE-STRUCTURES OF TIO2 (110) DETERMINED BY SCANNING-TUNNELING-MICROSCOPY - A NEW SURFACE-LIMITED PHASE OF TITANIUM-OXIDE [J].