Scanning near-field optical microscopy: transfer function and resolution limit

被引：9

作者：

Blattner, P ^{[1
]}

Herzig, HP ^{[1
]}

Dandliker, R ^{[1
]}

机构：

[1] Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland

来源：

OPTICS COMMUNICATIONS | 1998年 / 155卷 / 4-6期

关键词：

scanning near-field optical microscope; rigorous diffraction theory; sub-wavelength resolution;

D O I：

10.1016/S0030-4018(98)00401-5

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present scanning near-field optical microscopy as an optical instrument characterized by a transfer function. This approach gives some theoretical guidelines for the design of near-field optical measurement systems. We emphasize that it is important to distinguish between the resolution for the optical field and the resolution for the object. In addition, to solve the general inverse diffraction problem the measurement of phase and amplitude of the electromagnetic field is necessary. (C) 1998 Published by Elsevier Science B.V. All rights reserved.

引用

页码：245 / 250

页数：6

共 21 条

[1] Evanescent interferometry by scanning optical tunneling detection [J].