Influence of surface roughness of aluminum-doped zinc oxide buffer layers on the performance of inverted organic solar cells

被引：34

作者：

Cho, Sung-Woo ^{[2
]}

Kim, Young Tae ^{[2
]}

Shim, Won Hyun ^{[2
,3
]}

Park, Sun-Young ^{[2
]}

Kim, Kwang-Dae ^{[1
]}

Seo, Hyun Ook ^{[1
]}

Dey, Nilay Kumar ^{[1
]}

Lim, Jae-Hong ^{[2
]}

Jeong, Yongsoo ^{[2
]}

Lee, Kyu Hwan ^{[2
]}

Kim, Young Dok ^{[1
]}

Lim, Dong Chan ^{[2
]}

机构：

[1] Sungkyunkwan Univ, Dept Chem, Suwon 440746, South Korea

[2] Korea Inst Mat Sci, Mat Proc Div, Chang Won 641010, South Korea

[3] Pusan Natl Univ, Sch Mat Sci & Engn, Pusan 609735, South Korea

来源：

APPLIED PHYSICS LETTERS | 2011年 / 98卷 / 02期

关键词：

PHOTOVOLTAIC DEVICES; CARBON NANOTUBES; THIN-FILMS; TRANSPORT;

D O I：

10.1063/1.3537961

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Aluminum-doped zinc oxide (AZO) films (70 nm thick) with dissimilar surface roughness were created on indium tin oxide coated glass and were used as electrodes for inverted organic solar cells. The photovoltaic performance of the devices depended strongly on the surface roughness of the AZO films. Increases in the surface root-mean-square roughness of AZO films from 2.5 to 10.9 nm enhanced power conversion efficiency from 0.5% to 1.4% due to increased contact area between electrode and active layer. (c) 2011 American Institute of Physics. [doi:10.1063/1.3537961]

引用

页数：3

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