Surface micromachined microelectromechancial ohmic series switch using thin-film piezoelectric actuators

被引:65
作者
Polcawich, Ronald G. [1 ,2 ]
Pulskamp, Jeffrey S. [1 ]
Judy, Daniel
Ranade, Prashant
Trolier-McKinstry, Susan [2 ]
Dubey, Madan
机构
[1] USA, Res Lab, Adelphi Lab Ctr, Adv MicroDevices Branch, Adelphi, MD 20783 USA
[2] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
关键词
lead zirconate titanate (PZT); piezoelectric; reliability; RF microelectromechanical system (MEMS); switch; switching speed; temperature sensitivity;
D O I
10.1109/TMTT.2007.910072
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents results on a surface micromachined RF microelectromechanical switch that uses piezoelectric actuators. The switch uses solution chemistry-derived lead zirconate titanate thin films spun deposited onto a high-resistivity silicon substrate with coplanar waveguide transmission lines. Actuation voltages, applied via circuits independent of the RF circuitry, average less than 10 V, with switch operation demonstrated as low as 2 V. The series switch exhibits better than 20-dB isolation from dc up to 65 GHz and as large as 70 dB below 1 GHz. In the closed state, the switch has an insertion loss less than 1 dB up to 40 GHz, limited in this demonstration by substrate losses from the elastic layer used to stress control the piezoelectric actuators. Switching speeds for the different designs are in the range of 40-60 ms. Thermal sensitivity measurements show no change in isolation observed for temperatures up to 125 degrees C. However, an increase in actuation voltage is required at elevated temperatures.
引用
收藏
页码:2642 / 2654
页数:13
相关论文
共 26 条
[1]  
Budd K. D., 1985, British Ceramic Proceedings, P107
[2]   Selecting metal alloy electric contact materials for MEMS switches [J].
Coutu, RA ;
Kladitis, PE ;
Leedy, KD ;
Crane, RL .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2004, 14 (08) :1157-1164
[3]   Microswitches with sputtered Au, AuPd, Au-on-AuPt, and AuPtCu alloy electric contacts [J].
Coutu, Ronald A., Jr. ;
Reid, James R. ;
Cortez, Rebecca ;
Strawser, Richard E. ;
Kladitis, Paul E. .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2006, 29 (02) :341-349
[4]   High strain behavior of composite thin film piezoelectric membranes [J].
Demir, I ;
Olson, AL ;
Skinner, JL ;
Richards, CD ;
Richards, RF ;
Bahr, DF .
MICROELECTRONIC ENGINEERING, 2004, 75 (01) :12-23
[5]  
GERE J, 1997, MECH MATER, P400
[6]   Lead-zirconate-titanate-based piezoelectric micromachined switch [J].
Gross, SJ ;
Tadigadapa, S ;
Jackson, TN ;
Trolier-McKinstry, S ;
Zhang, QQ .
APPLIED PHYSICS LETTERS, 2003, 83 (01) :174-176
[7]   Residual stress behavior of thin plasma-enhanced chemical vapor deposited silicon dioxide films as a function of storage time [J].
Haque, MS ;
Naseem, HA ;
Brown, WD .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (07) :3129-3133
[8]   Theoretical calculations and performance results of a PZT thin film actuator [J].
Hoffmann, M ;
Küppers, H ;
Schneller, T ;
Böttger, U ;
Schnakenberg, U ;
Mokwa, W ;
Waser, R .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 2003, 50 (10) :1240-1246
[9]  
Holm R., 1969, ELECT CONTACTS THEOR
[10]   Piezoelectric and dielectric aging in Pb(Zr,Ti)O-3 thin films and bulk ceramics [J].
Kholkin, AL ;
Tagantsev, AK ;
Colla, EL ;
Taylor, DV ;
Setter, N .
INTEGRATED FERROELECTRICS, 1997, 15 (1-4) :317-324