Scanning thermal microscopy at nanometer scales: A new frontier in experimental heat transfer

被引:17
作者
Majumdar, A
Luo, K
Shi, Z
Varesi, J
机构
[1] Department of Mechanical & Environmental Engineering, University of California, Santa Barbara, CA
基金
美国国家科学基金会;
关键词
D O I
10.1080/08916159608946516
中图分类号
O414.1 [热力学];
学科分类号
摘要
The scanning thermal microscope (SThM) is providing the first opportunity to study thermal phenomena at nanometer scales. So far it has been used to thermally probe electrically heated devices such as 30- to 500-nm-wide metal lines, single transistors, and vertical-cavity surface-emitting quantum-wed lasers. It has been demonstrated that the SThM can reach an unprecedented spatial resolution of sub-10 nm. The ability to access this regime opens the Promising prospects of thermally and optically probing quantum structures and single molecules. It also creates the possibility of discovering new energy transport phenomena, since macroscopic laws and definitions of heat transfer break down at these scales.
引用
收藏
页码:83 / 103
页数:21
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