Impact and characterisation of heavy ion tracks on epitaxial growth

被引:3
作者
Baudenbacher, F
Dollinger, G
Ohnesorge, F
Bauer, M
Assman, W
Kinder, H
机构
[1] TECH UNIV MUNICH,PHYS DEPT E10,D-85747 GARCHING,GERMANY
[2] TECH UNIV MUNICH,PHYS DEPT E12,D-85747 GARCHING,GERMANY
[3] IBM CORP,DIV RES,PHYS GRP MUNICH,D-80799 MUNICH,GERMANY
[4] UNIV MUNICH,SEKT PHYS,D-85748 GARCHING,GERMANY
关键词
D O I
10.1016/0168-583X(95)01042-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The possibility of influencing the epitaxial relationship by heavy ion tracks has been investigated for high temperature superconducting films YBa2Cu3O7-delta (YBCO) on single crystalline MgO (100) substrates. The tracks are formed by irradiation with 120 MeV Au-197 ions at incidence angles of 1.5 degrees and 1.9 degrees from the surface plane. AFM images of irradiated surfaces reveal the presence of channels which are on average 130 nm long and 6 nm wide, The length of the surface tracks is described by cutting a 4.3 nm deep trench diagonally at an angle of 1.9 degrees relative to the track axis. The measured apparent depth of 1 nm agrees with this assumption due to our finite tip radius of about 20 nm. YBCO films grow on non-irradiated substrates with the in-plane epitaxial relationship YBCO[100]\\MgO[100], Heavy ion irradiation as described above with a fluence of 10(13) Au ions/cm(2) parallel to the (110) plane resulted in an almost complete change in epitaxial alignment, yielding YBCO[100]\\MgO[110]. In contrast, the in-plane orientation of YBCO did not change if the same density of tracks was created parallel to the MgO (100) plane, Although the results demonstrate the influence of heavy ion channels on the in-plane orientation, attempts to rotate the film axis by 20 degrees on MgO substrates failed.
引用
收藏
页码:327 / 332
页数:6
相关论文
共 17 条
[1]  
BAUDENBACHER F, 1992, HIGH TC SUPERCONDUCT, P265
[2]  
BAUER M, IN PRESS PHYSICA C
[3]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[4]   FORCE MICROSCOPY [J].
BINNIG, G .
ULTRAMICROSCOPY, 1992, 42 :7-15
[5]   STABILITY LIMITS OF THE PEROVSKITE STRUCTURE IN THE Y-BA-CU-O SYSTEM [J].
BORMANN, R ;
NOLTING, J .
APPLIED PHYSICS LETTERS, 1989, 54 (21) :2148-2150
[6]  
Daya DDNB, 1995, NUCL INSTRUM METH B, V106, P38, DOI 10.1016/0168-583X(95)00674-5
[7]   IMAGING CRYSTALS, POLYMERS, AND PROCESSES IN WATER WITH THE ATOMIC FORCE MICROSCOPE [J].
DRAKE, B ;
PRATER, CB ;
WEISENHORN, AL ;
GOULD, SAC ;
ALBRECHT, TR ;
QUATE, CF ;
CANNELL, DS ;
HANSMA, HG ;
HANSMA, PK .
SCIENCE, 1989, 243 (4898) :1586-1589
[8]   ATOMIC-RESOLUTION OF THE SILICON (111)-(7X7) SURFACE BY ATOMIC-FORCE MICROSCOPY [J].
GIESSIBL, FJ .
SCIENCE, 1995, 267 (5194) :68-71
[9]  
Givargizov E. I., 1991, ORIENTED CRYSTALLIZA
[10]   THERMALLY ACTIVATED PHASE SLIPPAGE IN HIGH-TC GRAIN-BOUNDARY JOSEPHSON-JUNCTIONS [J].
GROSS, R ;
CHAUDHARI, P ;
DIMOS, D ;
GUPTA, A ;
KOREN, G .
PHYSICAL REVIEW LETTERS, 1990, 64 (02) :228-231