Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains

被引：34

作者：

Gao, C ^{[1
]}

Duewer, F ^{[1
]}

Lu, YL ^{[1
]}

Xiang, XD ^{[1
]}

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 08期

关键词：

D O I：

10.1063/1.122111

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A nonlinear dielectric scanning tip microwave near-field microscope capable of submicron quantitative imaging of nonlinear dielectric constant was developed. This nondestructive technique was used to image the nonlinear dielectric constant profiles of an yttrium-doped LiNbO3 single crystal with periodically polarized ferroelectric domains. (C) 1998 American Institute of Physics. [S0003-6951(98)00634-2]

引用

页码：1146 / 1148

页数：3

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