A study of metal films using a spectrally resolved photon map obtained by spectrum mapping measurements of STM-induced light

被引：10

作者：

Nishitani, R ^{[1
]}

Umeno, T

Kasuya, A

机构：

[1] Kyushu Inst Technol, Dept Comp Sci & Elect, Iizuka, Fukuoka 820, Japan

[2] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 98077, Japan

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期

关键词：

D O I：

10.1007/s003390051117

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have carried out spectral mapping measurements of tunneling-induced luminescence in scanning tunneling microscopy (STM) of nanoscale gold metal particles on a graphite surface. The luminescence spectra are recorded at the same time as STM topography images by using an intensified charge coupled device (CCD) detector and a spectrograph. Based on the measurements, spectrally resolved photon-intensity images are obtained for various spectral bands. Those photon-intensity images are compared with the topography image. We have observed two types of spectrally dependent photon images. One is associated with a shorter-wavelength (similar to 650 nm) mode and the other a longer-wavelength (similar to 700 nm) mode. The photon map of shorter wavelength (similar to 650 nm) is correlated with grain morphology. The longer-wavelength mode reveals a high emission intensity for some grains. The result is discussed in relation to the microstructure geometry.

引用

页码：S139 / S143

页数：5

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