Test-retest consistency of the event-related desynchronization/event-related synchronization of the 4-6, 6-8, 8-10 and 10-12 Hz frequency bands during a memory task

被引:37
作者
Krause, CM
Sillanmäki, L
Häggqvist, A
Heino, R
机构
[1] Helsinki Univ Technol, Lab Computat Engn, Espoo 02015, Finland
[2] Univ Turku, Dept Clin Pharmacol, Turku, Finland
[3] Abo Akad Univ, Dept Psychol, SF-20500 Turku, Finland
[4] Univ Turku, Dept Stat, Turku 20014, Finland
[5] Univ Turku, Dept Psychol, Turku 20014, Finland
[6] Univ Turku, Ctr Cognit Neurosci, Turku 20014, Finland
基金
芬兰科学院;
关键词
event-related desynchronization; event-related synchronization; alpha band; theta band; test-retest; reliability;
D O I
10.1016/S1388-2457(01)00501-6
中图分类号
R74 [神经病学与精神病学];
学科分类号
摘要
Objective: The aim of this study was to determine the test-retest consistency of the event-related desynchronization/event-related synchronization (ERD/ERS) method during the performance of an auditory memory task. Methods: The EEG was recorded while 12 subjects performed an auditory memory task on two separate occasions (mean test-retest interval 9 days). Differences in the ERD/ERS responses between the first and second registrations were examined in 4 EEG frequency bands of interest: 4-6, 6-8, 8-10 and 10-12 Hz. Results: We observed significant differences in the ERD/ERS responses between the first and second registration In all studied frequency bands when examined as a function of time and experimental task. The test-retest reliability of the ERD/ERS values was highest in the theta frequency range (4-6 and 6-8 Hz), poorer in the 8-10 Hz and poorest in the 10-12 Hz alpha frequency range. Conclusions: The test-retest effect was seen in the ERD/ERS responses of all studied frequency bands during an auditory memory task. (C) 2001 Elsevier Science Ireland Ltd. All rights reserved.
引用
收藏
页码:750 / 757
页数:8
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