Observation of field-induced domain wall propagation in magnetic nanowires by magnetic transmission x-ray microscopy

被引：9

作者：

Bryan, M. T. ^{[1
]}

Fry, P. W. ^{[2
]}

Fischer, P. J. ^{[3
]}

Allwood, D. A. ^{[1
]}

机构：

[1] Univ Sheffield, Dept Mat Engn, Sheffield S1 3JD, S Yorkshire, England

[2] Univ Sheffield, Ctr Nanosci & Technol, Sheffield S3 7HQ, S Yorkshire, England

[3] LBNL CXRO, Berkeley, CA 94720 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2008年 / 103卷 / 07期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1063/1.2832656

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Magnetic transmission x-ray microscopy (M-TXM) is used to image domain walls in magnetic ring structures formed by a 300 nm wide, 24 nm thick Ni81Fe19 nanowire. Both transverse- and vortex-type domain walls are observed after application of different field sequences. Domain walls can be observed by comparing images obtained from opposite field sequences or else domain wall propagation observed by comparing successive images in a particular field sequence. This demonstrates the potential use of M-TXM in developing and understanding planar magnetic nanowire behavior. (C) 2008 American Institute of Physics.

引用

页数：3