X-ray speckle contrast variation across absorption edges

被引：9

作者：

Retsch, CC ^{[1
]}

McNulty, I ^{[1
]}

机构：

[1] Argonne Natl Lab, Argonne, IL 60439 USA

来源：

PHYSICAL REVIEW LETTERS | 2001年 / 87卷 / 07期

关键词：

D O I：

10.1103/PhysRevLett.87.077401

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We measured static x-ray speckle contrast variation with the incident photon energy across a sample-specific absorption edge. In this paper, we present a theoretical description of this energy dependency consistent with our data. We found that the contrast depends mainly on the imaginary part of the complex index of refraction in the sample, as well as on the instrumental resolution. The speckle contrast decreases as the absorption cross section in the sample increases at the absorption edge. This result is not predicted by commonly used theory.

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页码：77401 / 1

页数：4

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