Characterisation of light trapping in silicon films by spectral photoconductance measurements

被引：3

作者：

Campbell, P ^{[1
]}

Keevers, M ^{[1
]}

Vogl, B ^{[1
]}

机构：

[1] Univ New S Wales, Photovolta Special Res Ctr, Sydney, NSW 2052, Australia

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2001年 / 66卷 / 1-4期

基金：

澳大利亚研究理事会;

关键词：

light trapping measurement; photoconductance; silicon films;

D O I：

10.1016/S0927-0248(00)00172-0

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

This paper presents progress made in developing a method of measuring light trapping intrinsically free of uncertainties associated with reflector absorption and collection losses. These problems presently restrict analysis to uniformly absorbed wavelengths, which in thin films especially accounts for only a minor part of available light trapping benefit. We aim to extend photoconductance measurements, which presently are also similarly restricted, to nonuniformly absorbed wavelengths in order to fully characterise light trapping. Specimen preparation and measurement guidelines are given. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：187 / 193

页数：7

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