Computation of photoelectron and Auger-electron diffraction III. Evaluation of angle-resolved intensities PAD3

被引:5
作者
Chen, X
Harp, GR
Ueda, Y
Saldin, DK
机构
[1] Univ Wisconsin, Dept Phys, Milwaukee, WI 53201 USA
[2] Univ Wisconsin, Surface Studies Lab, Milwaukee, WI 53201 USA
[3] Ohio Univ, Dept Phys & Astron, Athens, OH 45701 USA
关键词
angle resolved; core-level; photoelectron; Auger; electron diffraction; surface structure; multiple scattering; electron; spectroscopy;
D O I
10.1016/S0010-4655(98)00032-0
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
In this paper, we describe the third part of a suite of computer programs for the computation of Auger- and photoelectron diffraction intensities, using the so-called concentric shell algorithm (CSA). The function of the present program is to calculate the diffraction intensities capable of being measured in a variety of different experimental configurations. The present program takes as its input the cluster transmission matrix calculated in the second part of this sequence of programs, as well as the spherical wave amplitudes of the atomic photoemission process, and other input specifying the type of experiment. The output of this program is a file containing the diffraction intensities in a form for direct comparison with experimental results. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:91 / 101
页数:11
相关论文
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