Circuit techniques for reducing the effects of op-amp imperfections: Autozeroing, correlated double sampling, and chopper stabilization

被引：1197

作者：

Enz, CC ^{[1
]}

Temes, GC ^{[1
]}

机构：

[1] OREGON STATE UNIV,DEPT ELECT & COMP ENGN,CORVALLIS,OR 97331

来源：

PROCEEDINGS OF THE IEEE | 1996年 / 84卷 / 11期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/5.542410

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In linear IC's fabricated in a low-voltage CMOS technology, the reduction of the dynamic range due to the de offset and low-frequency noise of the amplifiers becomes increasingly significant. Also, the achievable amplifier gain is often quite low in such a technology, since cascoding may not be a practical circuit option due to the resulting reduction of the output signal swing. In this paper, some old and some new circuit techniques will be described for the compensation of the amplifier most important nonideal effects including the noise (mainly thermal and 1/f noise), the input-referred de offset voltage, as well as the finite gain resulting in a nonideal virtual ground at the input.

引用

页码：1584 / 1614

页数：31

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