Shift of the Bragg position in grazing-incidence diffraction

被引:6
作者
Rhan, H [1 ]
Peisl, J [1 ]
机构
[1] TECH UNIV MUNCHEN WEIHENSTEPHAN, SEKT PHYS, D-80539 MUNICH, GERMANY
来源
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1996年 / 100卷 / 03期
关键词
D O I
10.1007/s002570050134
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The intensity distribution in grazing-incidence diffraction along the grazing exit angle, alpha(f), has been generally studied assuming the fulfilment of the Bragg condition, both experimentally and theoretically. We consider deviations of the incidence angle and detector position (theta) from the exact Bragg angle, theta(B), as well as variation of the incidence angle with respect to the surface, alpha(i), and lattice mismatching of layered structures. The so-called surface peak is caused by refraction and appears at the fixed angular position of the critical angle of the total external reflection, alpha(C). Beside it an additional peak occurs, that is explained by fulfilling the Bragg condition of the lateral wave vector components of incident and diffracted beams. This corresponds to the intersection of the truncation rod and the Ewald sphere. Therefore its angular position in the diffracted scattering fan depends on both alpha(i) and theta - theta(B). This additional peak is only visible if alpha(i) is below alpha(C) or theta > theta(B). These considerations have been verified experimentally on an InP layer.
引用
收藏
页码:365 / 368
页数:4
相关论文
共 10 条
[1]   X-RAY-DIFFRACTION UNDER SPECULAR REFLECTION CONDITIONS - IDEAL CRYSTALS [J].
AFANASEV, AM ;
MELKONYAN, MK .
ACTA CRYSTALLOGRAPHICA SECTION A, 1983, 39 (MAR) :207-210
[2]  
DIETRICH S, 1984, Z PHYS B CON MAT, V26, P27
[3]  
DOSCH H, 1992, SPRINGER TRACTS MODE, V126
[4]   X-RAY DETERMINATION OF THE GASB(111)2X2 SURFACE-STRUCTURE [J].
FEIDENHANSL, R ;
NIELSEN, M ;
GREY, F ;
JOHNSON, RL ;
ROBINSON, IK .
SURFACE SCIENCE, 1987, 186 (03) :499-510
[5]   X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE [J].
MARRA, WC ;
EISENBERGER, P ;
CHO, AY .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) :6927-6933
[6]   INVESTIGATIONS OF SEMICONDUCTOR SUPERLATTICES BY DEPTH-SENSITIVE X-RAY-METHODS [J].
RHAN, H ;
PIETSCH, U ;
RUGEL, S ;
METZGER, H ;
PEISL, J .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (01) :146-152
[7]   GRAZING-INCIDENCE DIFFRACTION OF X-RAYS IN SEMICONDUCTOR HETEROSTRUCTURES - APPLICATION OF THE INTEGRAL-MODE [J].
RHAN, H ;
PIETSCH, U .
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1990, 80 (03) :347-352
[8]  
SALDITT T, 1994, EUROP PHYS LETT
[9]  
VANLAUE M, 1960, ROTGENSTRAHLINTERFER
[10]   GRAZING-INCIDENCE DIFFRACTION AND THE DISTORTED-WAVE APPROXIMATION FOR THE STUDY OF SURFACES [J].
VINEYARD, GH .
PHYSICAL REVIEW B, 1982, 26 (08) :4146-4159