Electronic structure and superconducting gap of silicon clathrate Ba8Si46 studied with ultrahigh-resolution photoemission spectroscopy -: art. no. 172504

被引:29
作者
Yokoya, T [1 ]
Fukushima, A
Kiss, T
Kobayashi, K
Shin, S
Moriguchi, K
Shintani, A
Fukuoka, H
Yamanaka, S
机构
[1] Univ Tokyo, Inst Solid State Phys, Chiba 2778581, Japan
[2] Sumitomo Met Ind Ltd, Elect Engn Labs, Amagasaki, Hyogo 6600891, Japan
[3] Hiroshima Univ, Grad Sch Engn, Dept Appl Chem, Higashihiroshima 7398527, Japan
[4] JST, CREST, Kawaguchi 3320012, Japan
关键词
D O I
10.1103/PhysRevB.64.172504
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We study the electronic structure and superconducting transition of silicon clathrate Ba8Si46 (T-c = 8 K) using photoemission spectroscopy. We observe a narrow band at the Fermi level (E-F), whose width (similar to0.3 eV) is substantially smaller than that of band structure calculations (similar to1.5 eV). Ultrahigh-resolution measurements show a superconducting gap at 5.4 K [2 Delta (0)/k(B)T(c)=3.51]. Fine structures associated with phonons are observed within 70 meV of E-F. These results characterize Ba8Si46 as a weak-coupling superconductor most probably driven by phonon.
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页数:4
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