Test of pulse shape analysis using single Compton scattering events

被引：7

作者：

Abt, I. ^{[1
]}

Caldwell, A. ^{[1
]}

Kroeninger, K. ^{[1
]}

Liu, J. ^{[1
]}

Liu, X. ^{[1
]}

Majorovits, B. ^{[1
]}

机构：

[1] Max Planck Inst Phys & Astrophys, D-80805 Munich, Germany

来源：

EUROPEAN PHYSICAL JOURNAL C | 2008年 / 54卷 / 03期

关键词：

D O I：

10.1140/epjc/s10052-008-0555-0

中图分类号：

O412 [相对论、场论]; O572.2 [粒子物理学];

学科分类号：

摘要：

Procedures developed to separate single- and multiple-site events in germanium detector are tested with specially selected event samples provided by an 18-fold segmented prototype germanium detector for phase II of the germanium detector array, GERDA. The single Compton scattering, i.e. single-site, events are tagged by coincidently detecting the scattered photon with a second detector positioned at a defined angle. A neural network is trained to separate such events from events which come from multi-site dominated samples. Identification efficiencies of approximate to 80% are achieved for both single- and multi-site events.

引用

页码：425 / 433

页数：9

共 11 条

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