Development of ultra-fast X-ray computed tomography scanner system

被引：25

作者：

Hori, K ^{[1
]}

Fujimoto, T ^{[1
]}

Kawanishi, K ^{[1
]}

机构：

[1] Mitsubishi Heavy Ind Co Ltd, Takasago Res & Dev Ctr, Takasago, Hyogo 676, Japan

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1998年 / 45卷 / 04期

关键词：

D O I：

10.1109/23.708308

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The development of ultra-fast X-ray computed tomography (CT) scanner system has been performed. This system can operate under the scanning time of 0.5 milliseconds/slice and give 2000 slices/second The original object of interest is in a transient or unsettled state of multiphase flow to measure the instantaneous phase distribution. An improvement of scanning speed mas required to reduce the effects of motion artifact. The mechanical motion mechanism of conventional CT scanner is a major obstacle to improve the scanning speed. Therefore, the concept of electrical switching electron beam is adopted to reduce the scanning time. The developed present system has stationary 60 X-ray tubes and stationary 584 cadmium telluride (CdTe) semiconductor detectors. The excellent performance to the measurement and visualization of dynamic events of multiphase pow is confirmed by measuring the moving acrylic resin phantoms and the air-mater two phase flow in a tube or a 3X3 rod bundle. And, the feasibility is demonstrated to the medical field by trial application for the movement of dog's heart, though the requirement remains to improve the image quality. It was confirmed by a simulation that the improvement mill be performed by increasing the number of projections.

引用

页码：2089 / 2094

页数：6

共 8 条

[1]

BOYD DP, 1987, AM J CARDIAC IMAGING, V1, P175

[2] Application of cadmium telluride detector to high speed X-ray CT scanner [J].

Hori, K ;

Fujimoto, T ;

Kawanishi, K .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 380 (1-2) :397-401

[3]

HORI K, 1997, P OECD CSNI SPEC M A

[4]

Hori K., 1994, P 4 INT TOP M NUCL T

[5]

IWAI Y, 1988, IMAGE SYSTEMS CLIN A

[6]

Lorensen WE., 1987, PROC 14 ANN C COMPUT, V21, P163, DOI [DOI 10.1145/37402.37422, DOI 10.1145/37401.37422]

[7]

Rosenfeld A., 1982, Digital Picture Processing, V2nd

[8] STUDY OF THE PHOTODECAY IN CDTE X-RAY-DETECTORS [J].

WURM, P ;

HAGEALI, M ;

KOEBEL, JM ;

SIFFERT, P .

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 28 (1-3) :47-50

← 1 →