Analysis of multiple-tunnel junctions and their application to bidirectional electron pumps

被引：25

作者：

Jalil, MBA ^{[1
]}

Ahmed, H

Wagner, M

机构：

[1] Univ Cambridge, Cavendish Lab, Microelect Res Ctr, Cambridge CB3 0HE, England

[2] Univ Cambridge, Cavendish Lab, Hitachi Cambridge Lab, Cambridge CB3 0HE, England

来源：

JOURNAL OF APPLIED PHYSICS | 1998年 / 84卷 / 08期

关键词：

D O I：

10.1063/1.368688

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A quantitative analysis is performed of a bidirectional electron pump circuit that incorporates multiple-tunnel junctions (MTJs), with special emphasis on stability diagrams. The number of electrons transferred per cycle is calculated to be in general agreement with experimental data. The frequency and temperature conditions under which the circuit deviates from ideal pumping operation are evaluated, which suggests that the prospect for a metrological application is not improved by the presence of ultrasmall capacitances in the MTJs. (C) 1998 American Institute of Physics. [S0021-8979(98)08919-1]

引用

页码：4617 / 4624

页数：8

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