Uniform micro-sized α- and β-Si3N4 thin ribbons grown by a high-temperature thermal-decomposition/nitridation route

被引:38
作者
Hu, JQ
Bando, Y
Liu, ZW
Xu, FF
Sekiguchi, T
Zhan, JH
机构
[1] NIMS, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan
[2] NIMS, Nanomat Lab, Tsukuba, Ibaraki 3050044, Japan
关键词
crystal growth; nitrides; ribbons; scanning probe microscopy; silicon;
D O I
10.1002/chem.200305390
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Uniform micro-sized alpha- and beta-Si3N4 thin ribbons have been achieved by a high-temperature thermal-decomposition/nitridation route. As-grown ribbons were characterized by using powder X-ray diffraction, scanning electron microscopy, transmission electron microscopy, energy-dispersive X-ray spectroscopy, electron energy loss spectroscopy, and cathodoluminescence. These alpha- and beta-Si3N4 ribbons are structurally uniform micro-sized single crystals, and have a width of similar to2-3 microns, a thickness of similar to20-60 nm, and a length, that ranges from several hundreds of microns to the order of millimeters. A room-temperature cathodoluminescence spectrum recorded from these ribbons shows one intensive blue emission peak at similar to433 nm. The growth for the new ribbon form of this material is believed to be dominated by a vapor-solid process.
引用
收藏
页码:554 / 558
页数:5
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