Size modification of self-assembled InAs quantum dots by in situ etching

被引:20
作者
Schuler, H
Jin-Phillipp, NY
Phillipp, F
Eberl, K
机构
[1] Max Planck Inst Festkorperforsch, D-70567 Stuttgart, Germany
[2] Max Planck Inst Met Forsch, D-70567 Stuttgart, Germany
关键词
D O I
10.1088/0268-1242/13/11/001
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report an in situ etching treatment of self-assembled InAs islands using AsBr3 in a molecular beam epitaxy system which allows reshaping and downsizing of the quantum dots with atomic layer precision. AsBr3 etching of a thin GaAs layer covering the InAs islands results in an array of 10-15 nm size holes on the surface due to enhanced etching at locally strained areas., The dots of a second InAs layer nucleate preferentially within the etched dips, which are vertically aligned with the underlying InAs dots. The photoluminescence linewidth is improved as compared to non-etched samples with equal spacer thickness.
引用
收藏
页码:1341 / 1345
页数:5
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