Mapping Spatial Heterogeneity in Cu(In1-xGax)Se2 Nanocrystal-Based Photovoltaics with Scanning Photocurrent and Fluorescence Microscopy

被引:26
作者
Ostrowski, David P. [2 ]
Glaz, Micah S. [2 ]
Goodfellow, Brian W. [1 ]
Akhavan, Vahid A. [1 ]
Panthani, Matthew G. [1 ]
Korgel, Brian A. [1 ]
Bout, David A. Vanden [2 ]
机构
[1] Univ Texas Austin, Dept Chem Engn, Texas Mat Inst, Austin, TX 78712 USA
[2] Univ Texas Austin, Dept Chem & Biochem, Ctr Nano & Mol Sci & Technol, Austin, TX 78712 USA
关键词
PROBE FORCE MICROSCOPY; POLYTHIOPHENE/FULLERENE SOLAR-CELLS; ORGANIC PHOTOVOLTAICS; OPTICAL MICROSCOPY; CURRENT GENERATION; THIN-FILMS; MORPHOLOGY; DEVICES; PERFORMANCE; HISTORY;
D O I
10.1002/smll.201001274
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Scanning photocurrent and fluorescence microscopy, along with local voltage-dependent photocurrent measurements, are used to study spatial variations in electronic and optical properties across an as-fabricated, functional Cu(In1-xGax)Se2 (CIGS) nanocrystal-based photovoltaic device. Through correlation of local morphological features with spatial variations in device properties, a greater understanding of photovoltaic performance is obtained. Copyright © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:2832 / 2836
页数:5
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