Asymmetric distribution of oxygen concentration in the Si melt of a Czochralski system

被引:11
作者
Yi, KW [1 ]
Kakimoto, K [1 ]
Niu, ZG [1 ]
Eguchi, M [1 ]
Noguchi, H [1 ]
Nakamura, S [1 ]
Mukai, K [1 ]
机构
[1] KYUSHU INST TECHNOL,DEPT MAT SCI & ENGN,TOBATA KU,KITAKYUSHU,FUKUOKA 804,JAPAN
关键词
D O I
10.1149/1.1836508
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Oxygen concentration in the Si melt of a Czochralski system was measured by immersing an oxygen sensor in the melt. The measurement clarified the existence of an inhomogeneous distribution of oxygen whose pattern was similar to the temperature distribution in the melt. This result suggests that the oxygen profile in the Si melt is not axisymmetric, although the furnace structure is axisymmetric. This oxygen fluctuation is proposed to be one reason for striations appearing in the grown crystals.
引用
收藏
页码:722 / 725
页数:4
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