Experimental evidence of photoinduced expansion in hydrogenated amorphous silicon using bending detected optical lever method

被引:48
作者
Gotoh, T [1 ]
Nonomura, S
Nishio, M
Nitta, S
Kondo, M
Matsuda, A
机构
[1] Gifu Univ, Dept Elect & Comp Engn, Gifu 50111, Japan
[2] Electrotech Lab, Thin Film Silicon Solar Cells Superlab, Tsukuba, Ibaraki 305, Japan
关键词
D O I
10.1063/1.121513
中图分类号
O59 [应用物理学];
学科分类号
摘要
Photoinduced structural change in hydrogenated amorphous silicon (a-Si:H) has been studied by a sensitive bending detection method using an optical lever. We observed that a-Si:H films show not only thermal expansion due to a photothermal effect but also residual and persistent expansion after light soaking. The volume change is recovered by thermal annealing at 200 degrees C. A dehydrogenated sample annealed at 550 degrees C and a microcrystalline sample, in which photoinduced defects are not created, show little photoinduced expansion. The photoinduced expansion and photoinduced defect density show identical time evolution. These results suggest that the photoinduced expansion is related to the photoinduced defect creation. A quantitative evaluation of the photoinduced expansion indicates that the photoinduced structural change is spread over several molecular volumes around a photocreated defect. (C) 1998 American Institute of Physics.
引用
收藏
页码:2978 / 2980
页数:3
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