Growth of strength of Bragg gratings written in H2 loaded telecommunication fibre during CW UV post-exposure

被引:19
作者
Ramecourt, D
Niay, P
Bernage, P
Riant, I
Douay, M
机构
[1] USTL, Lab PhLAM, CERLA, F-59655 Villeneuve Dascq, France
[2] Alcatel CIT, Alcatel Corp Res Ctr, F-91460 Marcoussis, France
关键词
D O I
10.1049/el:19990231
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Bragg gratings have been written in an H-2 loaded telecommunication fibre using a CW UV fringe pattern. CW UV fringeless exposure at the grating place gave rise to an amplification of the refractive index modulation amplitude. This post-writing exposure has to be taken into account when fabricating grating based components.
引用
收藏
页码:329 / 331
页数:3
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