First demonstration of GaAs CMOS

被引:7
作者
Hong, M [1 ]
Baillargeon, JN [1 ]
Kwo, J [1 ]
Mannaerts, JP [1 ]
Cho, AY [1 ]
机构
[1] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
来源
2001 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS | 2000年
关键词
D O I
10.1109/ISCS.2000.947180
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using Ga2O3(Gd2O3) as a gate dielectric and conventional ion implantation for source, drain, and isolation, we have fabricated and demonstrated a GaAs complementary metal-oxide-semiconductor field-effect-transistor (CMOS) inverter.
引用
收藏
页码:345 / 350
页数:6
相关论文
共 17 条
[1]  
[Anonymous], 1963, IEEE SOLID STATE CIR, DOI DOI 10.1109/ISSCC.1963.1157450
[2]  
HOEFFLINGER B, 1980, SER I PHYSICS C, V57
[3]   Low interface state density oxide-GaAs structures fabricated by in situ molecular beam epitaxy [J].
Hong, M ;
Passlack, M ;
Mannaerts, JP ;
Kwo, J ;
Chu, SNG ;
Moriya, N ;
Hou, SY ;
Fratello, VJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (03) :2297-2300
[4]   Initial growth of Ga2O3(Gd2O3) on GaAs:: Key to the attainment of a low interfacial density of states [J].
Hong, M ;
Lu, ZH ;
Kwo, J ;
Kortan, AR ;
Mannaerts, JP ;
Krajewski, JJ ;
Hsieh, KC ;
Chou, LJ ;
Cheng, KY .
APPLIED PHYSICS LETTERS, 2000, 76 (03) :312-314
[5]  
HONG M, 1999, ENCY ELECT ELECT ENG, V19, P87
[6]   Passivation of GaAs using (Ga2O3)1-x(Gd2O3)x, 0≤x≤1.0 films [J].
Kwo, J ;
Murphy, DW ;
Hong, M ;
Opila, RL ;
Mannaerts, JP ;
Sergent, AM ;
Masaitis, RL .
APPLIED PHYSICS LETTERS, 1999, 75 (08) :1116-1118
[7]  
MULLER RS, 1986, DEV ELECT INTEGRATED
[8]  
PARRILLO LC, 1983, VLSI TECHNOLOGY, pCH11
[9]   Low D-it, thermodynamically stable Ga2O3-GaAs interfaces: Fabrication, characterization, and modeling [J].
Passlack, M ;
Hong, M ;
Mannaerts, JP ;
Opila, RL ;
Chu, SNG ;
Moriya, N ;
Ren, F ;
Kwo, JR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (02) :214-225
[10]   Ga2O3(Gd2O3)/InGaAs enhancement-mode n-channel MOSFET's [J].
Ren, F ;
Kuo, JM ;
Hong, M ;
Hobson, WS ;
Lothian, JR ;
Lin, J ;
Tsai, HS ;
Mannaerts, JP ;
Kwo, J ;
Chu, SNG ;
Chen, YK ;
Cho, AY .
IEEE ELECTRON DEVICE LETTERS, 1998, 19 (08) :309-311