Semi-insulating GaAs as a relaxation semiconductor

被引:17
作者
Santana, J [1 ]
Jones, BK [1 ]
机构
[1] Univ Lancaster, Dept Phys, Lancaster LA1 4YB, England
关键词
D O I
10.1063/1.367941
中图分类号
O59 [应用物理学];
学科分类号
摘要
It is shown that semi-insulating GaAs diodes exhibit all the qualitative electrical properties expected from a relaxation semiconductor. The degree of ideality increases after irradiation by neutrons for liquid encapsulated Czochralski and liquid phase epitaxy (LPE) material although LPE material is almost lifetimelike directly from manufacture. Experimental results are shown for current-voltage and capacitance-voltage frequency over a range of temperatures for samples in the low- and high-space charge limit conditions. The implications for commercial GaAs and other compound semiconductor devices are discussed. (C) 1998 American Institute of Physics.
引用
收藏
页码:7699 / 7705
页数:7
相关论文
共 21 条
[1]   CORRELATION BETWEEN TRAP CHARACTERIZATION BY LOW-FREQUENCY NOISE, MUTUAL CONDUCTANCE DISPERSION, OSCILLATIONS AND DLTS IN GAAS-MESFETS [J].
ABDALA, MA ;
JONES, BK .
SOLID-STATE ELECTRONICS, 1992, 35 (12) :1713-1719
[2]  
BERWICK K, 1994, IOP C SER, V135, P304
[3]  
CASTALDINI A, 1994, P 2 INT WORKSH GALL
[4]   EFFECT OF NEAR-CONTACT REGIONS ON THE INTERPRETATION OF OHMIC BEHAVIOR IN TRAP-DOMINATED RELAXATION SEMICONDUCTORS [J].
DERHACOBIAN, N ;
MADOK, JH ;
HAEGEL, NM .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (06) :2294-2298
[5]   CONDUCTION IN RELAXATION REGIME [J].
DOHLER, GH ;
HEYSZENAU, H .
PHYSICAL REVIEW B, 1975, 12 (02) :641-649
[6]  
Jones B. K., 1996, Third International Workshop: Gallium Arsenide and Related Compounds, P73
[7]   Ohmic I-V characteristics in semi-insulating semiconductor diodes [J].
Jones, BK ;
Santana, J ;
McPherson, M .
SOLID STATE COMMUNICATIONS, 1998, 105 (09) :547-549
[8]   Semiconductor detectors for use in high radiation damage environments - Semi-insulating GaAs or silicon? [J].
Jones, BK ;
Santana, J ;
McPherson, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1997, 395 (01) :81-87
[9]  
JONES BK, IN PRESS SOLID STATE
[10]  
KATAI VO, 1987, SOLID STATE ELECT, V30, P897