Zinc oxide nanoparticles incorporated in ultrathin layer silicate films and their photocatalytic properties

被引:90
作者
Szabó, T [1 ]
Németh, J [1 ]
Dékány, I [1 ]
机构
[1] Univ Szeged, Hungarian Acad Sci, Dept Colloid Chem, Nanostruct Mat Res Grp, H-6720 Szeged, Hungary
关键词
semiconductor nanoparticles; layer silicates; ultrathin films; XRD; AFM; photodegradation;
D O I
10.1016/j.colsurfa.2003.09.010
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This study has been conducted to determine whether the nanosized semiconductor crystals qualify as photocatalysts also in that case when they are self-assembled to form ultrathin films in the thickness range of 10-500 nm. For this purpose, multilayer films of Zn(OH)(2) and ZnO nanoparticles were prepared by the layer-by-layer self-assembly method on glass surface. A transparent layer silicate, synthetic hectorite was used as sticking material. The quality of multilayer formation has been investigated in detail by absorption spectrophotometry, XRD and atomic force microscopy (AFM). Evidence was found for the uniform deposition of the different components. The increment of nanofilm thickness was constant and independent from the number of layers deposited previously. Photocatalytic measurements were made with model organic materials beta-naphtol and industrial kerosene in a home-made loop-type batch reactor. Decomposition has been continously monitored by UV spectrometry. Significant photodegradation of the organic molecules were only found in the presence of the nanofilms. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:23 / 35
页数:13
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