Development of an advanced Kirkpatrick-Baez microscope

被引：62

作者：

Kodama, R ^{[1
]}

Ikeda, N ^{[1
]}

Kato, Y ^{[1
]}

Katori, Y ^{[1
]}

Iwai, T ^{[1
]}

Takeshi, K ^{[1
]}

机构：

[1] CANON INC,NAKAHARA KU,KAWASAKI,KANAGAWA 211,JAPAN

来源：

OPTICS LETTERS | 1996年 / 21卷 / 17期

关键词：

D O I：

10.1364/OL.21.001321

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have developed an advanced Kirkpatrick-Baez (AKB) x-ray microscope to diagnose laser-produced plasmas. The AKB microscope is composed of two pairs of hyperbolic and elliptic mirrors to avoid spherical aberration and field obliquity. The spatial response of the microscope has been measured by x-ray backlighting a fine grid with laser-plasma x rays. A spatial resolution of better than 3 mu m has been obtained with 2.5-keV x rays over the field of 800 mu m at a magnification of 25. This microscope has been applied for laser implosion experiments, resulting in high-resolution images of the compressed cores. (C) 1996 Optical Society of America

引用

页码：1321 / 1323

页数：3

共 11 条

[1] A SOFT-X-RAY MICROPROBE USING AN AXISYMMETRICAL TANDEM TOROIDAL MIRROR [J].

AOKI, S ;

YAMAJI, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 (10) :1768-1771

[2] FORMATION OF OPTICAL IMAGES BY X-RAYS [J].

KIRKPATRICK, P ;

BAEZ, AV .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1948, 38 (09) :766-774

[3]

Kodama R, 1995, P SOC PHOTO-OPT INS, V2523, P165, DOI 10.1117/12.220982

[4]

KODAMA R, IN PRESS P 11 TOP C

[5] ROUGHNESS MEASUREMENT OF X-RAY MIRROR SURFACES [J].

KUNIEDA, H ;

HAYAKAWA, S ;

HIRANO, T ;

KII, T ;

NAGASE, F ;

SATO, N ;

TAWARA, Y ;

MAKINO, F ;

YAMASHITA, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1986, 25 (09) :1292-1299

[6] QUANTITATIVE MEASUREMENTS WITH X-RAY MICROSCOPES IN LASER-FUSION EXPERIMENTS [J].

MARSHALL, FJ ;

SU, QC .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (01) :725-727

[7] WOLTER X-RAY MICROSCOPE CHARACTERIZATION MEASUREMENTS ON NOVA [J].

REMINGTON, BA ;

GLENDINNING, SG ;

WALLACE, RJ ;

ROTHMAN, S ;

MORALES, R .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (10) :5080-5082

[8]

SAUNEUF R, 1993, 22 EUR C LAS INT MAT

[9] CALIBRATED 4-COLOR X-RAY MICROSCOPE FOR LASER PLASMA DIAGNOSTICS [J].

SEWARD, F ;

DENT, J ;

BOYLE, M ;

KOPPEL, L ;

HARPER, T ;

STOERING, P ;

TOOR, A .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (04) :464-470

[10] X-RAY MICROPROBE WITH A PAIR OF ELLIPTICAL MIRRORS [J].

SUZUKI, Y ;

UCHIDA, F ;

HIRAI, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (09) :L1660-L1662

← 1 2 →