Simplified motional heating rate measurements of trapped ions

被引：93

作者：

Epstein, R. J. ^{[1
]}

Seidelin, S. ^{[1
]}

Leibfried, D. ^{[1
]}

Wesenberg, J. H. ^{[1
]}

Bollinger, J. J. ^{[1
]}

Amini, J. M. ^{[1
]}

Blakestad, R. B. ^{[1
]}

Britton, J. ^{[1
]}

Home, J. P. ^{[1
]}

Itano, W. M. ^{[1
]}

Jost, J. D. ^{[1
]}

Knill, E. ^{[1
]}

Langer, C. ^{[1
]}

Ozeri, R. ^{[1
]}

Shiga, N. ^{[1
]}

Wineland, D. J. ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA

来源：

PHYSICAL REVIEW A | 2007年 / 76卷 / 03期

关键词：

D O I：

10.1103/PhysRevA.76.033411

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have measured motional heating rates of trapped atomic ions, a factor that can influence multi-ion quantum logic gate fidelities. Two simplified techniques were developed for this purpose: one relies on Raman sideband detection implemented with a single laser source, while the second is even simpler and is based on time-resolved fluorescence detection during Doppler recooling. We applied these methods to determine heating rates in a microfrabricated surface-electrode trap made of gold on fused quartz, which traps ions 40 mu m above its surface. Heating rates obtained from the two techniques were found to be in reasonable agreement. In addition, the trap gives rise to a heating rate of 300 +/- 30 s(-1) for a motional frequency of 5.25 MHz, substantially below the trend observed in other traps.

引用

页数：5

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