A microRaman study of the structural properties of PLD high T-c superconducting thin films

被引：11

作者：

Martinez, O

Jimenez, J

Martin, P

Prieto, AC

Degoy, S

Chambonnet, D

Belouet, C

Nicoletti, S

Correra, L

机构：

[1] ETSII, VALLADOLID 47011, SPAIN

[2] FAC CIENCIAS, VALLADOLID 47011, SPAIN

[3] ALCATEL ALSTHOM RECH, F-91460 MARCOUSSIS, FRANCE

[4] CNR, IST LAMEL, I-40129 BOLOGNA, ITALY

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1996年 / 270卷 / 1-2期

关键词：

D O I：

10.1016/0921-4534(96)00478-9

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

YBCO thin films grown by PLD (Pulsed Laser Deposition) are studied by microRaman spectroscopy, The results reveal a high degree of structural inhomogeneity, that is analyzed in terms of different causes: stoichiometry failures, both and cationic, strain, preferred orientation of the grains, disorder, defects. The influence that these structural features fan have on the Raman spectrum is discussed, Complementary measurements of X-ray diffraction and Rutherford backscattering spectroscopy were carried our in order to support the stoichiometric and grain orientation data deduced from Raman spectroscopy. On the basis of the results presented herein. we can conclude that microRaman spectroscopy is a powerful tool for the assessment of thin film structural properties, although an extrapolation of the Raman data obtained for YBCO single crystals must be handled with care in thin films.

引用

页码：144 / 154

页数：11

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