X-ray characterisation of chemical solution deposited PbTiO3 films with high Ca doping

被引:14
作者
Calzada, ML [1 ]
Bretos, I [1 ]
Jiménez, R [1 ]
Ricote, J [1 ]
Mendiola, J [1 ]
机构
[1] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain
关键词
thin film; perovskite; X-ray diffraction; ferroelectric; dielectric;
D O I
10.1016/j.tsf.2003.10.076
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Single crystalline phase lead calcium titanate (Pb1-xCaTiO3) (PCT) thin films, with Ca2+ contents between 24 and 50 at.%, have been prepared onto Pt/(100)MgO by chemical solution deposition and rapid thermal processing. The sol-gel process used enables the synthesis of air-stable and precipitate-free solutions with high Ca2+ contents (up to 50 at.% of substitution of Pb2+ by Ca2+ in the PbTiO3 perovskite has been tested). Structure and texture of the crystalline films have been determined by X-ray diffraction (XRD), using the Bragg-Brentano geometry. Strain of the films structure has been calculated by the variance method using the 111 perovskite peak of the grazing incidence XRD patterns. Data obtained by XRD and dielectric properties measured in the PCT films are compared with those reported for bulk ceramics. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:211 / 215
页数:5
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