Epitaxial silicon and germanium on buried insulator heterostructures and devices

被引:71
作者
Bojarczuk, NA [1 ]
Copel, M [1 ]
Guha, S [1 ]
Narayanan, V [1 ]
Preisler, EJ [1 ]
Ross, FM [1 ]
Shang, H [1 ]
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
关键词
D O I
10.1063/1.1637716
中图分类号
O59 [应用物理学];
学科分类号
摘要
Future microelectronics will be based upon silicon or germanium-on-insulator technologies and will require an ultrathin (<10 nm), flat silicon or germanium device layer to reside upon an insulating oxide grown on a silicon wafer. The most convenient means of accomplishing this is by epitaxially growing the entire structure on a silicon substrate. This requires a high quality crystalline oxide and the ability to epitaxially grow two dimensional, single crystal films of silicon or germanium on top of this oxide. We describe a method based upon molecular beam epitaxy and solid-phase epitaxy to make such structures and demonstrate working field-effect transistors on germanium-on-insulator layers. (C) 2003 American Institute of Physics.
引用
收藏
页码:5443 / 5445
页数:3
相关论文
共 12 条
[1]   INFLUENCE OF SURFACTANTS IN GE AND SI EPITAXY ON SI(001) [J].
COPEL, M ;
REUTER, MC ;
VONHOEGEN, MH ;
TROMP, RM .
PHYSICAL REVIEW B, 1990, 42 (18) :11682-11689
[2]   POINT-DEFECTS AND DOPANT DIFFUSION IN SILICON [J].
FAHEY, PM ;
GRIFFIN, PB ;
PLUMMER, JD .
REVIEWS OF MODERN PHYSICS, 1989, 61 (02) :289-384
[3]   Lattice-matched, epitaxial, silicon-insulating lanthanum yttrium oxide heterostructures [J].
Guha, S ;
Bojarczuk, NA ;
Narayanan, V .
APPLIED PHYSICS LETTERS, 2002, 80 (05) :766-768
[4]   BORON-CONTROLLED SOLID-PHASE EPITAXY OF GERMANIUM ON SILICON - A NEW NONSEGREGATING SURFACTANT [J].
KLATT, J ;
KRUGER, D ;
BUGIEL, E ;
OSTEN, HJ .
APPLIED PHYSICS LETTERS, 1994, 64 (03) :360-362
[5]   Crystalline oxides on silicon: The first five monolayers [J].
McKee, RA ;
Walker, FJ ;
Chisholm, MF .
PHYSICAL REVIEW LETTERS, 1998, 81 (14) :3014-3017
[6]   Growth and characterization of epitaxial Si/(LaxY1-x)2O3/Si heterostructures [J].
Narayanan, V ;
Guha, S ;
Bojarczuk, NA ;
Ross, FM .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (01) :251-258
[7]   Interfacial oxide formation and oxygen diffusion in rare earth oxide-silicon epitaxial heterostructures [J].
Narayanan, V ;
Guha, S ;
Copel, M ;
Bojarczuk, NA ;
Flaitz, PL ;
Gribelyuk, M .
APPLIED PHYSICS LETTERS, 2002, 81 (22) :4183-4185
[8]   CHARACTERIZATION OF SURFACES BY GRAZING X-RAY REFLECTION - APPLICATION TO STUDY OF POLISHING OF SOME SILICATE-GLASSES [J].
NEVOT, L ;
CROCE, P .
REVUE DE PHYSIQUE APPLIQUEE, 1980, 15 (03) :761-779
[9]   SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS [J].
PARRATT, LG .
PHYSICAL REVIEW, 1954, 95 (02) :359-369
[10]  
TAKAGI S, IN PRESS IEEE 2003 S