Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy

被引：46

作者：

Ghasemi, S. Alireza ^{[1
,2
]}

Goedecker, Stefan ^{[1
,2
]}

Baratoff, Alexis ^{[1
,2
]}

Lenosky, Thomas ^{[3
]}

Meyer, Ernst ^{[1
,2
]}

Hug, Hans J. ^{[4
]}

机构：

[1] Univ Basel, Dept Phys, CH-4056 Basel, Switzerland

[2] Univ Basel, Natl Ctr Res Nanoscale Sci, CH-4056 Basel, Switzerland

[3] Ohio State Univ, Dept Mat Sci & Engn, Columbus, OH 43210 USA

[4] Swiss Fed Lab Mat Testing & Res, CH-8600 Dubendorf, Switzerland

来源：

PHYSICAL REVIEW LETTERS | 2008年 / 100卷 / 23期

关键词：

Atomistic simulations - Different structure - Dissipation mechanism - Local minimums - Lower-energy structure - Metastabilities - Noncontact atomic force microscopy - Thermal activation;

D O I：

10.1103/PhysRevLett.100.236106

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Atomistic simulations considering larger tip structures than hitherto assumed reveal novel dissipation mechanisms in noncontact atomic force microscopy. The potential energy surfaces of realistic silicon tips exhibit many energetically close local minima that correspond to different structures. Most of them easily deform, thus causing dissipation arising from hysteresis in force versus distance characteristics. Furthermore, saddle points which connect local minima can suddenly switch to connect different minima. Configurations driven into metastability by the tip motion can thus suddenly access lower energy structures when thermal activation becomes allowed within the time required to detect the resulting average dissipation.

引用

页数：4

共 21 条

[1] Energy dissipation in tapping-mode atomic force microscopy [J].