Complex phase tracing method for fringe pattern analysis

被引：6

作者：

Kozlowski, J ^{[1
]}

Serra, G ^{[1
]}

机构：

[1] Univ Nuorese, Dipartimento Tecnol Ottiche, Assoc Ist Libera, I-08100 Nuoro, Italy

来源：

APPLIED OPTICS | 1999年 / 38卷 / 11期

关键词：

D O I：

10.1364/AO.38.002256

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present what we believe to be a novel complex phase tracing method for fringe pattern analysis related to the phase-locked loop idea. The image with deformed complex fringes is analyzed with lexicographic scansion that leads directly to the investigated phase without unwrapping. Robustness of the procedure is ensured by the delay mechanism in the process of calculating the reference value. A numerical model and examples of application of the presented method are given. (C) 1999 Optical Society of America.

引用

页码：2256 / 2262

页数：7

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