Quantitative noninterferometric lorentz microscopy

被引:50
作者
De Graef, M [1 ]
Zhu, YM
机构
[1] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
[2] Brookhaven Natl Lab, Dept Appl Sci, Upton, NY 11973 USA
关键词
D O I
10.1063/1.1355337
中图分类号
O59 [应用物理学];
学科分类号
摘要
Noninterferometric phase reconstruction based on the transport of intensity equation (TIE) is applied to experimental images for a Permalloy thin film and to a computational magnetization pattern for a high density magnetic recording medium. An alternative derivation of the TIE is given, based on linear image formation theory. A compact formal solution, suitable for numerical computation, is given. (C) 2001 American Institute of Physics.
引用
收藏
页码:7177 / 7179
页数:3
相关论文
共 10 条
[1]   SIGNIFICANCE OF ELECTROMAGNETIC POTENTIALS IN THE QUANTUM THEORY [J].
AHARONOV, Y ;
BOHM, D .
PHYSICAL REVIEW, 1959, 115 (03) :485-491
[2]   Quantitative phase-sensitive imaging in a transmission electron microscope [J].
Bajt, S ;
Barty, A ;
Nugent, KA ;
McCartney, M ;
Wall, M ;
Paganin, D .
ULTRAMICROSCOPY, 2000, 83 (1-2) :67-73
[3]  
BARTY A, 2000, EXPT METHODS PHYSICA, V36
[4]   HIGH-RESOLUTION IMAGING OF MAGNETIC-STRUCTURES IN THE TRANSMISSION ELECTRON-MICROSCOPE [J].
CHAPMAN, JN .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1989, 3 (04) :355-358
[5]   PHASE RETRIEVAL WITH THE TRANSPORT-OF-INTENSITY EQUATION - MATRIX SOLUTION WITH USE OF ZERNIKE POLYNOMIALS [J].
GUREYEV, TE ;
ROBERTS, A ;
NUGENT, KA .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (09) :1932-1941
[6]   COMPUTATION OF ELECTRON-DIFFRACTION PATTERNS IN LORENTZ ELECTRON-MICROSCOPY OF THIN MAGNETIC-FILMS [J].
MANSURIPUR, M .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (04) :2455-2464
[7]   Noninterferometric phase imaging with partially coherent light [J].
Paganin, D ;
Nugent, KA .
PHYSICAL REVIEW LETTERS, 1998, 80 (12) :2586-2589
[8]  
Spence J.C. H., 1988, EXPT HIGH RESOLUTION
[10]  
Volkl E., 1999, Introduction to Electron Holography, DOI 10.1007/978-1-4615-4817-1