Advanced etching of silicon based on deep reactive ion etching for silicon high aspect ratio microstructures and three-dimensional micro- and nanostructures

被引:226
作者
Marty, F
Rousseau, L
Saadany, B
Mercier, B
Francais, O
Mita, Y
Bourouina, T
机构
[1] ESIEE, ESYCOM, EA 2552, F-93162 Noisy Le Grand, France
[2] Univ Tokyo, VLSI Design & Educ, Bunkyo Ku, Tokyo, Japan
关键词
micromachining; DRIE; HARMS; sub-micron; 3D; silicon;
D O I
10.1016/j.mejo.2005.04.039
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Different processes involving an inductively coupled plasma reactor are presented either for deep reactive ion etching or for isotropic etching of silicon. On one hand, high aspect ratio microstructures with aspect ratio up to 107 were obtained on sub-micron trenches. Application to photonic MEMS is presented. Isotropic etching is also used either alone or in combination with anisotropic etching to realize various 3D shapes. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:673 / 677
页数:5
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